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Photovoltaic cells - Measurement of light-induced degradation of crystalline silicon photovoltaic cells

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Photovoltaic cells - Measurement of light-induced degradation of crystalline silicon photovoltaic cells1 Scope This part of IEC 63202 describes procedures for measuring the light induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance. The purpose of this document is to provide

BS EN 15293:2018 includes some technical changes with respect to CEN/TS 15293:2011

During transport

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4 Analysis of data

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measured at atmospheric pressure

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Wooden structure

up to a few years ago

EN 60512-25-1

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The recommendations in this International Standard apply where the desired result is extended-term retention of the data encoded on the disk

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